References

List of publications

A.A. Schmidt, H. Eggers, K. Herwig, R. Anton, "Comparative investigation of the nucleation and growth of f.c.c.metal particles (Rh, Ir, Ni, Pd, Pt, Cu, Ag, Au) on amorphous carbon and SiO2 substrates during vap our deposition at elevated temperatures",
Surf. Science 349 (1996) 301 - 316.
A.A. Schmidt, R. Anton, "Anomalous growth behaviour of Pd-Au and Ag-Au alloy particles during vapour deposition on carbon substrates at elevated temperatures",
Surf. Science 322 (1996) 307-324.
A.A. Schmidt, J.Offermann, R. Anton, "The role of neutral oxygen radicals in the oxidation of Ag films",
Thin Solid Films 281-282 (1996) 105-107.
R. Anton and A.A. Schmidt, "Anomalous nucleation and growth of metal and alloy particles during vapor deposition on amorphous substrates",
Surf. Science 357-358 (1996) 835 - 839.
R. R. Anton, "Nanophysik einmal anders - Experimente zur Kinetik des Wachstums dünner Schichten",
Phys. in uns. Zeit, Heft 5 (1996) 221-228.
Ch. Heyn, M. Harsdorff, "Routine measurement of the absolute As4 flux in a molecular beam epitaxy system with conventional RHEED equipment",
Appl. Surf. Science 100/101 (1996) 494-497.
A. Schnellbügel, B. Selle, R. Anton, "Determination of the stoichiometry and the Yb2+/Yb3+ ratio in YbFx optical IAD films by in-situ XPS and RBS analysis",
Microchimica Acta 125 (1997) 239-243.
Chr. Heyn, T. Fanke, R. Anton and M. Harsdorff, "Correlation between island- formation kinetics, surface roughening, and RHEED oscillation damping during GaAs homoepitaxy",
Phys. Rev., 56(20) (1997) 13483 - 13489.
T. Franke, P. Kreutzer, Th. Zacher, W. Naumann, and R. Anton, "In-situ RHEED, AFM, and REM investigations of the surface recovery of MBE-grown GaAs(001)-layers during growth interruptions",
Journal of Crystal Growth, 193 (1998) 451 - 459.
M. Hannss, W. Naumann and R. Anton, "Performance of a tilt-compensating scanner in atomic force microscopy",
Scanning 20 (1998) 501 - 507.
R. Anton and I. Schneidereit, "In situ TEM investigations of dendritic growth of Au particles on HOPG",
Phys. Rev. B 58 (1998) 13874 - 13881.
P. Kreutzer, Th. Zacher, W. Naumann, T. Franke, and R. Anton, "Comparative REM and AFM investigations of InAs(001) surfaces",
Ultramicroscopy, 76 (1999) 107 - 114.
Ch. Heyn, T. Franke, R. Anton, "Modelling of compound semiconductor epitaxy",
J. of Cryst. Growth, 201/202 (1999) 67 - 72.
R. Anton, Th. Wiegner, W. Naumann, M. Liebmann, Chr. Klein, Chr. Bradley, "Design and performance of a versatile, cost-effective microwave electron cyclotron resonance plasma source for surface and thin film processing",
Rev. Sci. Instr. 71 (2000) 1177 - 1180.
M. Schäfer, W. Naumann, T. Finnberg, M. Hannss, A. Dutschke, R. Anton, "UV/ozone activated growth of oxide layers on InAs(001) surfaces and oxide desorption under arsenic pressure",
Appl. Surf. Sci. 158 (2000) 147 - 158.
R. Anton, P. Kreutzer, "In situ TEM evaluation of the growth kinetics of Au particles on highly oriented graphite at elevated temperatures",
Phys. Rev. B 61 (2000) 16077 - 16083.
P. Kreutzer, R. Anton, "TEM investigations on the growth of the icosahedric phase in AlMn films produced by simultaneous deposition of the components",
Materials Science and Engineering A 294-296 (2000) 854 - 858.
A. Schnellbügel, R. Anton, "On background subtraction for quantitative analysis of x-ray photoelectron spectra of rare earth fluorides",
submitted to be published in Surface Science (2001).

Last modified: 28/06/2001